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JGA Designs Semi-Custom Data Capture Systems
for OEMs
Orange, CA - March, 1999 - Jon Goldman Associates
(JGA) now offers data capture and analysis systems for semiconductor
equipment OEMs. Utilizing a semi-custom data capture package
developed for your equipment, and a group of off-the-shelf
analysis tools, OEMs can provide their customers with access
to pertinent process information, facilitating problem solving
and reducing scrap and rework. Included with each system is
JGA's Universal System Tools (UST), a family of applications
to quickly obtain equipment and process information. The data
capture and UST systems are designed to run on networked Windows
95/98/NT based PCs in a fab, office or home.
Development of a semi-custom data capture system is made
easy through the use of a library of pre-designed equipment
interface tools. Data capture is performed internally in the
equipment, leaving the equipment SECS port available for a
host interface.
Included in the Universal System Tools are BayView, which
provides real-time equipment status information over a network,
File Navigator, a tool for locating specific trace data stored
on an individual run basis, and WinGFX, the trace data graphics
utility loaded with features to help end-users mine the most
relevant information.
Also included is Trend Viewer 2000, a powerful trend analysis
program, capable of revealing subtle process changes, equipment
variations and equipment degradation.
Jon Goldman Associates, based in Orange, CA, has been
providing data mining software solutions to the semiconductor
industry for over ten years. Founder and President Dr. Jon
Goldman has been serving the semiconductor industry for more
than 25 years. He is the holder of several patents, including
LPCVD deposition of Silicon Nitride, LTO, and BPSG. JGA's
data analysis tools are widely used in the industry by both
end users and equipment manufacturers to reduce down time
and wafer scrap by implementing and improving SPC control.
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