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Jon Goldman Associates Signs Agreement
with National Semiconductor
Orange, CA - April, 1999 - Jon Goldman Associates
(JGA) has signed an agreement with National Semiconductor
to provide JGA's Universal System Tools (UST) and Data Capture
Upgrade to CFM NT for use on National's Thermco TMX diffusion
furnaces. The purchase will upgrade National's OS/2 platforms
to NT platforms and will make them Y2K compliant. The Windows
NT™ platform, already operating on some of National's furnaces,
provides greater network and system flexibility options. JGA's
software system performs data collection and analysis of diffusion
processes to quickly obtain equipment and process information.
National Semiconductor has been a customer of Jon Goldman
Associates for almost 10 years. According to Andy Yarr, Senior
Systems Development Engineer, National Semiconductor, Scotland,
"National has a fab-wide anti-scrap program in place. This
upgrade continues our momentum toward reaching our performance
goals and continues the refinement of JGA's part in this already
successful anti-scrap program."
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"National's migration to our CFM NT product platform is significant,"
said Kerry Eszlinger, Director of Systems Engineering for
JGA. "It shows a continued commitment to our meeting their
growing SPC and anti-scrap needs as well as their confidence
in us to fulfill these needs into the next century. We're
very pleased with this continued relationship."
Jon Goldman Associates, based in Orange, CA, has been
providing data mining software solutions to the semiconductor
industry for over ten years. Founder and President Dr. Jon
Goldman has been serving the semiconductor industry for more
than 25 years. He is the holder of several patents, including
LPCVD deposition of Silicon Nitride, LTO, and BPSG. JGA's
data analysis tools are widely used in the industry by both
end users and equipment manufacturers to reduce down time
and wafer scrap by implementing and improving SPC control.
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