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Data Mining Systems for the Semiconductor Industry

JGA & ICCI - One Company For All Your Diffusion Control Needs PRESS CENTER
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Data Mining Applied to Any Fab Tool Data - Using File Conversion, Reporting and SPC Analysis Tools

Orange, CA - September, 1999 - Jon Goldman Associates (JGA) introduces Data Mining for any Fab tool. A new GOLDMAN DATA™ Generator Kit uses any data your fab tools already provide and converts it into a format that allows it to be used with the Goldman System™ -- JGA’s extensive software library of Data Mining utilities.

The Kit includes the ActiveX™ file control tools you need to build a Visual Basic application to convert your data to GOLDMAN DATA™. The Kit includes sample software code. JGA also provides semi-custom programming services to deliver completed file conversion utilities. Once the data files are in GOLDMAN DATA format, they can be analyzed using the entire suite of Goldman System Workstation, Client and Server utilities. These provide SQL database and maintenance utilities to fuel trend analysis and user access to data. Any tool data file can be analyzed by simply pointing to it. Critical Event and Alert Condition criteria, set by the user, are applied to the data. A key to the Goldman System is the ability of the system to notify the user of an alert violation or critical event.

Notification can include paging personnel, sending email, signaling from a light tower or by disabling equipment. Reports can be scheduled to print at specific times on chosen days.

Universal System Tools™ provide access to the data and range from basic process run data viewing tools to sophisticated process management and SPC utilities. For use with any Windows NT PC on the network, the package consists of File Navigator, Graphics Utility, SPC Administrator, ReportViewer, trendviewer 2000 and AlertViewer.

File Navigator organizes and maintains data files in a logical and accessible fashion. Graphics Utility provides versatility and power for analyzing trace data. The SPC Administrator configures the Critical Event and Alert Condition criteria used by the Report Generator for its SPC calculations. They can be viewed with Report Viewer. trendviewer 2000 enables the user to create and store custom queries to search the database. AlertViewer provides detailed information about the number and types of SPC alerts generated by the process equipment over specified time intervals with the aim of highlighting abnormal variations.


Jon Goldman Associates, based in Orange, CA, has been providing data mining software solutions to the semiconductor industry for over ten years. Founder and President Dr. Jon Goldman has been serving the semiconductor industry for more than 25 years. He is the holder of several patents, including LPCVD deposition of Silicon Nitride, LTO, and BPSG. JGA's data analysis tools are widely used in the industry by both end users and equipment manufacturers to reduce down time and wafer scrap by implementing and improving SPC control.

                                                                                                       

                                                                                                         


Copyright (c) 2006, Jon Goldman Associates


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