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Jon Goldman Associates Unveils Website
Featuring Data Mining Information
Orange, CA - March, 2001 -- Jon Goldman Associates
(JGA) has just unveiled its new website, www.jga-inc.com,
designed to help semiconductor manufacturers learn how data
capture can improve their process yields through improved
quality, rapid process error and defect detection, and reduced
downtime and scrap. Technical articles such as "Trace Data
-- Yesterday's News Or Key To Vastly Superior Equipment Performance",
"SPC and Equipment Productivity", and "The High-bandwidth
Digital Data Network: A New Tool for Process Improvement",
and charts on what types of data can be captured and the ways
to use it, are available. The GOLDMAN SYSTEM™ captures your
data, or takes the data you already have (such as spreadsheets,
MS Access, flat text file or binary formats), and converts
it using a proprietary file conversion process. Once converted,
all these System Features are available for your data analysis.
The site explains how data capture and process control can
be used in applications such as Novellus CVD and Applied Materials
P5X Family of Systems, Thermco TMX Furnaces, TEL 3100, 3200,
4000 and TS400Z Series Furnaces and BTI 7355 Series Furnaces.
A detailed description of JGA products is also highlighted.
Jon Goldman Associates, based in Orange, CA, has been
providing data mining software solutions to the semiconductor
industry for over ten years. Founder and President Dr. Jon
Goldman has been serving the semiconductor industry for more
than 25 years. He is the holder of several patents, including
LPCVD deposition of Silicon Nitride, LTO, and BPSG. JGA's
data analysis tools are widely used in the industry by both
end users and equipment manufacturers to reduce down time
and wafer scrap by implementing and improving SPC control.
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