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Jon Goldman Associates Acquires Integrated
Control Concepts, Inc.
Expands capabilities to control and manage diffusion, LPCVD
and other equipment.
Contact: Andrea Roberts, A·R Marketing
858-451-8666; aroberts@san.rr.com
April 10, 2002 - Orange, CA - Jon Goldman Associates,
Inc. (JGA), manufacturer of data capture and process management
software for the semiconductor industry, announces the acquisition
of Integrated Control Concepts, Inc. (ICCI), Hollis, New Hampshire.
ICCI, founded in 1983, manufactures diffusion and LPCVD process
controllers and software used throughout the semiconductor
industry. Presently, each company will continue to operate
under its respective name. Manufacturing, operations, and
sales of ICCI products will be maintained in the New Hampshire
facility under the direction of general manager, Bob Bowman.
Mr. Bowman will report to President Jon Goldman. JGA operations
and the headquarters for the two companies will remain in
Orange, California, under Kerry Eszlinger, vice president,
chief operations officer.
"We are all looking forward to furthering the vision created
by Don Landis, president and founder of ICCI, who passed away
in 2000," stated Jon Goldman, president of Jon Goldman Associates.
"Don put a lot of creative energy into ICCI, and we feel privileged
to be a partner in carrying his vision forward. There is a
lot of synergy between our two companies' product lines. We
have been supplying software for data capture and analysis
of diffusion furnaces, primarily Thermco and TEL, as well
as for other manufacturing tools for about twelve years. ICCI
provides process controllers as well as cell control software
for ICCI and Bruce furnace controllers. Combining these capabilities
enables us to provide semiconductor manufacturers with an
extremely broad range of software-intensive monitoring and
control products for legacy furnaces and other process equipment."
"JGA brings process knowledge and software resources and expertise
that will help keep ICCI's products on the leading edge. The
combination of the two companies provides a more complete
product line as we continue to expand globally, especially
in Asia and Japan," stated ICCI's general manager Bob Bowman.
ICCI designs and provides custom control solutions in the
semiconductor industry for a variety of process applications
such as crystal growing, gas distribution, chemical vapor
deposition, surface state diffusion/oxidation, and wet spray
processing systems. The control systems typically consist
of dedicated controller microprocessors networked to PC supervisory
hosts and to production and statistical process control systems.
Jon Goldman Associates, based in Orange, CA, is in its twelfth
year of providing data mining software solutions to the semiconductor
industry. Founder and President Dr. Jon Goldman has been serving
the semiconductor industry for more than 25 years. He is the
holder of several patents, including LPCVD deposition of Silicon
Nitride, LTO, and BPSG. JGA's data analysis tools are widely
used in the industry by both end users and equipment manufacturers
to reduce downtime and wafer scrap by implementing and improving
SPC control. Visit the JGA and ICCI websites at www.JGA-Inc.com
and www.ICCI-Inc.com.
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Jon Goldman Associates
Kerry Eszlinger
2237 N. Batavia Street
Orange, CA 92865
Phone: (714) 283-5889
Fax: (714) 283-2884
Kerry@JGA-Inc.com
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ICCI
Kenneth Winchell
17 Clinton Drive
Hollis, NH 03049
Phone: (603) 889-8922
Fax: (603) 595-0775
kwinchell@ICCI-Inc.com |
A·R Marketing, Inc.
Andrea Roberts
PO Box 501528
San Diego, CA 92150
Phone: (858) 451-8666
Fax: (858) 451-8777
aroberts@san.rr.com
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Jon Goldman Associates, based in Orange, CA, has been
providing data mining software solutions to the semiconductor
industry for over ten years. Founder and President Dr. Jon
Goldman has been serving the semiconductor industry for more
than 25 years. He is the holder of several patents, including
LPCVD deposition of Silicon Nitride, LTO, and BPSG. JGA's
data analysis tools are widely used in the industry by both
end users and equipment manufacturers to reduce down time
and wafer scrap by implementing and improving SPC control.
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